Defects in two-dimensional materials (such as an atom-thick sheet of graphene) can dramatically alter the way that the ...
Abstract: In response to the issue of poor detection performance on wafer surface defect spots and elongated scratches, an improved RT-DETR method for wafer surface defect detection is proposed.
Theoretical studies on enhancement mechanisms of surface-enhanced Raman scattering (SERS) are usually carried out with full quantum mechanical methods to capture the specific interactions between ...
driven by the growing range of microscope applications and the development of novel microscopes, increasing awareness and funding for R&D, continuous technological advancements, and a rising focus on ...
Abstract: Surface defect recognition (SDR) with limited data is a common challenge in industrial production. Recent methods generally utilize generative adversarial network (GAN) to generate defect ...
This project is a prototype system that i have built which detects any visual defect in a tablet moving on the conveyor belt in Real-Time and removes only the defected ones.
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The surface wettability of the samples was characterized using a commercially available contact angle goniometer (Holmarc, India, model no.: HO-IAD-CAM-01A). The fluorescence intensity measurements ...
Flow Imaging Microscopy (FIM) represents a significant leap forward in particle analysis since it merges the strengths of traditional microscopy and volumetric particle analysis. It provides sharp ...
The need to assure quality is driving the adoption of non-destructive battery inspection techniques such as Scanning Acoustic Microscopy ... entire surface/interface. In addition, these advances also ...