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"Electrons get confused: Researchers may have observed the fastest melting of all time." ScienceDaily. ScienceDaily, 4 November 2010. <www.sciencedaily.com / releases / 2010 / 11 / 101103135350.htm>.
An electrons retention model for localized charge, trapped in ONO stacked dielectric, is introduced utilizing the nitride read-only memory (NROM) device. The observed reduction in threshold voltage ...
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