MILPITAS, Calif., July 20, 2020 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced the revolutionary eSL10™ e-beam patterned-wafer defect inspection system.

KLA Introduced 4 AI Metrology/Inspection Systems A Year Before Applied Materials Mar. 17, 2021 3:42 PM ET Applied Materials, Inc. (AMAT) Stock, KLAC Stock AMAT, KLAC 33 Comments ...

MILPITAS, Calif. , Jan. 19, 2012 /PRNewswire/ — Today KLA-Tencor Corporation (NASDAQ: KLAC), announced three new wafer defect inspection systems for leading-edge chip manufacturers: the 2900, Puma ...

The Voyager 1015 patterned wafer defect inspection system closes a long-standing industry gap in after-develop inspection (ADI), leveraging novel illumination, collection and sensor architecture ...

KLA dominates the semiconductor process control market with 50-80% market share across inspection and metrology segments, ...

KLA has announced the eSL10 e-beam patterned-wafer defect inspection system, which is designed to accelerate time-to-market for high-performance logic and memory chips, including those that rely ...

--Today, KLA Corporation announced the launch of the Kronos™ 1190 wafer-level packaging inspection system, the ICOS™ F160XP die sorting and inspection system and the next generation of the ...

KLA-Tencor's new 8900 high speed patterned-wafer defect inspection system represents a single-tool solution for image-sensor color filter and microlens development and production applications.

LONDON — KLA-Tencor Corp. has developed a photomask inspection system called Starlight-2 that is intended for use with 65-nm node masks and below. The system's inspection capabilities are designed for ...

KLA-Tencor has announced its next-generation LED patterned wafer inspection tool, the ICOS WI-2280. Designed specifically for defect inspection and 2D metrology for LED applications, the ICOS WI ...

--Today KLA Corporation announced the revolutionary eSL10™ e-beam patterned-wafer defect inspection system. The new system is designed to accelerate time-to-market for high-performance logic and ...