Combine scanning electron microscopy and elemental analytics: the best-in-class EDS geometry of Sigma increases your analytical productivity, especially on beam sensitive samples. Get analytical ...

The ZEISS Xradia 410 Versa encompasses all the benefits of the VersaXRM family of 3D X-ray microscopes for computed tomography. Xradia 410 Versa is uniquely designed to bridge cost/performance ...

Stereoscan MK1, the first commercial SEM built in 1965 by the Cambridge Instrument Company. (Image: Carl Zeiss Microscopy) This instrument laid the groundwork for the modern Scanning Electron ...

Image Credit: Carl Zeiss Raw Materials ISO 25178 surface roughness evaluation of a Ti-6Al-4V test sample. Results are very similar between XRM and ZEISS Smartproof 5 confocal microscope. Image Credit: ...

Alternatively, utilize the Materials Apps to examine microstructure, grain size, and layer thickness. Image Credit: Carl Zeiss Microscopy GmbH See the Difference at 1 kV and Below — Enhanced ...

Stereo microscopes come in two configurations ... Aubrey Lambert, marketing manager at Carl Zeiss-UK, attributes ...

The Crossbeam 550 Samplefab from Zeiss is a focused ion beam scanning electron microscope (FIB-SEM), designed for automated ...

The LSM 9 series with Airyscan 2 represents the next big step in the evolution of confocal microscopy. With a focus on usability, utility, and throughput, the Airyscan 2 detector from ZEISS fully ...